NEW AUTOMATIC TESTING ARCHITECTURE FOR INTEGRATED CIRCUITS
نویسندگان
چکیده
منابع مشابه
Testing Superconductor Logic Integrated Circuits
—Superconductor logic has the potential of extremely low-power consumption and ultra-fast digital signal processing. Unfortunately, the obtained yield of the present processes is low and specific faults occur. This paper deals with fault-modelling, Design-for-Test structures, and ATPG for these integrated circuits. Index Terms— Fault modelling, Design-for-Test, Defect Monitor Structures, ATPG
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ژورنال
عنوان ژورنال: The International Conference on Electrical Engineering
سال: 2006
ISSN: 2636-4441
DOI: 10.21608/iceeng.2006.33556